Citation: Jw. Mcbride et al., ARE ROOT MOBILITY DURING CONTACT OPENING AT HIGH-CURRENT, IEEE transactions on components, packaging, and manufacturing technology. Part A, 21(1), 1998, pp. 61-67
Citation: Pa. Jeffery et al., 3D FINITE-ELEMENT ANALYSIS MODELING OF THE ARC CHAMBER OF A CURRENT LIMITING MINIATURE CIRCUIT-BREAKER, Compel, 17(1-3), 1998, pp. 244-251