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Results:
1-23
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Results: 23
Authors:
SIMPSON ML
SAYLER GS
APPLEGATE BM
RIPP S
NIVENS DE
PAULUS MJ
JELLISON GE
Citation: Ml. Simpson et al., BIOLUMINESCENT-BIOREPORTER INTEGRATED-CIRCUITS FORM NOVEL WHOLE-CELL BIOSENSORS, Trends in biotechnology, 16(8), 1998, pp. 332-338
Authors:
JELLISON GE
BOATNER LA
Citation: Ge. Jellison et La. Boatner, OPTICAL FUNCTIONS OF UNIAXIAL ZNO DETERMINED BY GENERALIZED ELLIPSOMETRY, Physical review. B, Condensed matter, 58(7), 1998, pp. 3586-3589
Authors:
JELLISON GE
Citation: Ge. Jellison, SPECTROSCOPIC ELLIPSOMETRY DATA-ANALYSIS - MEASURED VERSUS CALCULATEDQUANTITIES, Thin solid films, 313, 1998, pp. 33-39
Authors:
JELLISON GE
MODINE FA
DOSHI P
ROHATGI A
Citation: Ge. Jellison et al., SPECTROSCOPIC ELLIPSOMETRY CHARACTERIZATION OF THIN-FILM SILICON-NITRIDE, Thin solid films, 313, 1998, pp. 193-197
Authors:
SIMPSON ML
DRESS WB
ERICSON MN
JELLISON GE
SITTER DN
WINTENBERG AL
FRENCH DF
Citation: Ml. Simpson et al., A PHOTOSPECTROMETER REALIZED IN A STANDARD INTEGRATED-CIRCUIT PROCESS, Review of scientific instruments, 69(2), 1998, pp. 377-383
Authors:
MERKULOV VI
LOWNDES DH
JELLISON GE
PURETZKY AA
GEOHEGAN DB
Citation: Vi. Merkulov et al., STRUCTURE AND OPTICAL-PROPERTIES OF AMORPHOUS DIAMOND FILMS PREPARED BY ARF LASER-ABLATION AS A FUNCTION OF CARBON ION KINETIC-ENERGY, Applied physics letters, 73(18), 1998, pp. 2591-2593
Authors:
JELLISON GE
MODINE FA
BOATNER LA
Citation: Ge. Jellison et al., MEASUREMENT OF THE OPTICAL FUNCTIONS OF UNIAXIAL MATERIALS BY 2-MODULATOR GENERALIZED ELLIPSOMETRY - RUTILE (TIO2), Optics letters, 22(23), 1997, pp. 1808-1810
Authors:
YU XH
BATES JB
JELLISON GE
HART FX
Citation: Xh. Yu et al., A STABLE THIN-FILM LITHIUM ELECTROLYTE - LITHIUM PHOSPHORUS OXYNITRIDE, Journal of the Electrochemical Society, 144(2), 1997, pp. 524-532
Authors:
LUBBEN D
ERES G
JELLISON GE
WESTBROOK RD
WOOD RF
Citation: D. Lubben et al., GROWTH AND DOPING OF SI LAYERS BY MOLECULAR-JET CHEMICAL-VAPOR-DEPOSITION - DEVICE FABRICATION, Applied physics letters, 71(19), 1997, pp. 2812-2814
Authors:
JELLISON GE
MODINE FA
Citation: Ge. Jellison et Fa. Modine, 2-MODULATOR GENERALIZED ELLIPSOMETRY - EXPERIMENT AND CALIBRATION, Applied optics, 36(31), 1997, pp. 8184-8189
Authors:
JELLISON GE
MODINE FA
Citation: Ge. Jellison et Fa. Modine, 2-MODULATOR GENERALIZED ELLIPSOMETRY - THEORY, Applied optics, 36(31), 1997, pp. 8190-8198
Authors:
DOSHI P
JELLISON GE
ROHATGI A
Citation: P. Doshi et al., CHARACTERIZATION AND OPTIMIZATION OF ABSORBING PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITED ANTIREFLECTION COATINGS FOR SILICON PHOTOVOLTAICS, Applied optics, 36(30), 1997, pp. 7826-7837
Authors:
PURETZKY AA
GEOHEGAN DB
JELLISON GE
MCGIBBON MM
Citation: Aa. Puretzky et al., COMPARATIVE DIAGNOSTICS OF ARF-LASER AND KRF-LASER GENERATED CARBON PLUMES USED FOR AMORPHOUS DIAMOND-LIKE CARBON-FILM DEPOSITION, Applied surface science, 96-8, 1996, pp. 859-865
Authors:
JELLISON GE
Citation: Ge. Jellison, THE CALCULATION OF THIN-FILM PARAMETERS FROM SPECTROSCOPIC ELLIPSOMETRY DATA, Thin solid films, 291, 1996, pp. 40-45
Authors:
JELLISON GE
MODINE FA
Citation: Ge. Jellison et Fa. Modine, PARAMETERIZATION OF THE OPTICAL FUNCTIONS OF AMORPHOUS MATERIALS IN THE INTERBAND REGION, Applied physics letters, 69(3), 1996, pp. 371-373
Authors:
JELLISON GE
MODINE FA
Citation: Ge. Jellison et Fa. Modine, PARAMETERIZATION OF THE OPTICAL FUNCTIONS OF AMORPHOUS MATERIALS IN THE INTERBAND REGION (VOL 69, PG 371, 1996), Applied physics letters, 69(14), 1996, pp. 2137-2137
Authors:
JELLISON GE
WITHROW SP
MCCAMY JW
BUDAI JD
LUBBEN D
GODBOLE MJ
Citation: Ge. Jellison et al., OPTICAL FUNCTIONS OF ION-IMPLANTED, LASER-ANNEALED HEAVILY-DOPED SILICON, Physical review. B, Condensed matter, 52(20), 1995, pp. 14607-14614
Authors:
MCKEE RA
WALKER FJ
SPECHT ED
JELLISON GE
BOATNER LA
HARDING JH
Citation: Ra. Mckee et al., INTERFACE STABILITY AND THE GROWTH OF OPTICAL-QUALITY PEROVSKITES ON MGO, Physical review letters, 72(17), 1994, pp. 2741-2744
Authors:
JELLISON GE
MODINE FA
Citation: Ge. Jellison et Fa. Modine, OPTICAL FUNCTIONS OF SILICON AT ELEVATED-TEMPERATURES, Journal of applied physics, 76(6), 1994, pp. 3758-3761
Authors:
JELLISON GE
BOATNER LA
LOWNDES DH
MCKEE RA
GODBOLE M
Citation: Ge. Jellison et al., OPTICAL FUNCTIONS AND TRANSPARENT THIN-FILMS OF SRTIO3, BATIO3, AND SIOX DETERMINED BY SPECTROSCOPIC ELLIPSOMETRY, Applied optics, 33(25), 1994, pp. 6053-6058
Authors:
JELLISON GE
Citation: Ge. Jellison, DATA-ANALYSIS FOR SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 234(1-2), 1993, pp. 416-422
Authors:
DARKEN LS
JELLISON GE
Citation: Ls. Darken et Ge. Jellison, RESOLUTION DEGRADATION OF COAXIAL P-TYPE GERMANIUM DETECTORS DUE TO HOLE TRAPPING BY POINT-DEFECTS, Journal of applied physics, 74(7), 1993, pp. 4557-4560
Authors:
JELLISON GE
CHISHOLM MF
GORBATKIN SM
Citation: Ge. Jellison et al., OPTICAL FUNCTIONS OF CHEMICAL-VAPOR-DEPOSITED THIN-FILM SILICON DETERMINED BY SPECTROSCOPIC ELLIPSOMETRY, Applied physics letters, 62(25), 1993, pp. 3348-3350
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