Authors: YOUNG AP SCHAFER J JESSEN GH BANDHU R BRILLSON LJ LUCOVSKY G NIIMI H

Citation: Ap. Young et al., CATHODOLUMINESCENCE MEASUREMENTS OF SUBOXIDE BAND-TAIL AND SI DANGLING BOND STATES AT ULTRATHIN SI-SIO2 INTERFACES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2177-2181