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Authors: GOSSET LG GANEM JJ TRIMAILLE I RIGO S ROCHET F DUFOUR G JOLLY F STEDILE FC BAUMVOL IJR
Citation: Lg. Gosset et al., HIGH-RESOLUTION DEPTH PROFILING IN SILICON OXYNITRIDE FILMS USING NARROW NUCLEAR-REACTION RESONANCES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 521-527

Authors: ROCHET F JOLLY F BOURNEL F DUFOUR G SIROTTI F CANTIN JL
Citation: F. Rochet et al., ETHYLENE ON SI(001)-2X1 AND SI(111)-7X7 - X-RAY PHOTOEMISSION SPECTROSCOPY WITH SYNCHROTRON-RADIATION, Physical review. B, Condensed matter, 58(16), 1998, pp. 11029-11042
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