Authors:
GOSSET LG
GANEM JJ
TRIMAILLE I
RIGO S
ROCHET F
DUFOUR G
JOLLY F
STEDILE FC
BAUMVOL IJR
Citation: Lg. Gosset et al., HIGH-RESOLUTION DEPTH PROFILING IN SILICON OXYNITRIDE FILMS USING NARROW NUCLEAR-REACTION RESONANCES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 521-527
Authors:
ROCHET F
JOLLY F
BOURNEL F
DUFOUR G
SIROTTI F
CANTIN JL
Citation: F. Rochet et al., ETHYLENE ON SI(001)-2X1 AND SI(111)-7X7 - X-RAY PHOTOEMISSION SPECTROSCOPY WITH SYNCHROTRON-RADIATION, Physical review. B, Condensed matter, 58(16), 1998, pp. 11029-11042