Authors:
ERSHOV M
LIU HC
LI L
BUCHANAN M
WASILEWSKI ZR
JONSCHER AK
Citation: M. Ershov et al., NEGATIVE CAPACITANCE EFFECT IN SEMICONDUCTOR-DEVICES, I.E.E.E. transactions on electron devices, 45(10), 1998, pp. 2196-2206
Citation: Ak. Jonscher, ENERGY CRITERION IN THE INTERPRETATION OF DIELECTRIC-RELAXATION, Applied physics. A, Solids and surfaces, 56(5), 1993, pp. 405-408
Citation: Mk. Anis et Ak. Jonscher, FREQUENCY AND TIME-DOMAIN MEASUREMENTS ON HUMID SAND AND SOIL, Journal of Materials Science, 28(13), 1993, pp. 3626-3634