Authors: NOYAN IC JORDANSWEET J LINIGER EG KALDOR SK

Citation: Ic. Noyan et al., CHARACTERIZATION OF SUBSTRATE THIN-FILM INTERFACES WITH X-RAY MICRODIFFRACTION/, Applied physics letters, 72(25), 1998, pp. 3338-3340

Authors: CARLSSON JRA CLEVENGER L MADSEN LD HULTMAN L LI XH JORDANSWEET J LAVOIE C ROY RA CABRAL C MORALES G LUDWIG KL STEPHENSON GB HENTZELL HTG

Citation: Jra. Carlsson et al., PHASE-FORMATION SEQUENCES IN THE SILICON-PHOSPHORUS SYSTEM - DETERMINED BY IN-SITU SYNCHROTRON AND CONVENTIONAL X-RAY-DIFFRACTION MEASUREMENTS AND PREDICTED BY A THEORETICAL-MODEL, Philosophical magazine. B. Physics of condensed matter. Statistical mechanics, electronic, optical and magnetic, 75(3), 1997, pp. 363-376

Authors: SVILAN V RODBELL KP CLEVENGER LA CABRAL C ROY RA LAVOIE C JORDANSWEET J HARPER JME

Citation: V. Svilan et al., CRYSTALLOGRAPHIC TEXTURE OF C54 TITANIUM DISILICIDE AS A FUNCTION OF DEEP-SUBMICRON STRUCTURE GEOMETRY, Journal of electronic materials, 26(9), 1997, pp. 1090-1095

Authors: CLEVENGER LA CABRAL C ROY RA LAVOIE C JORDANSWEET J BRAUER S MORALES G LUDWIG KF STEPHENSON GB

Citation: La. Clevenger et al., FORMATION OF A CRYSTALLINE METAL-RICH SILICIDE IN THIN-FILM TITANIUM SILICON REACTIONS/, Thin solid films, 289(1-2), 1996, pp. 220-226

Authors: CLEVENGER LA ROY RA CABRAL C SAENGER KL BRAUER S MORALES G LUDWIG KF GIFFORD G BUCCHIGNANO J JORDANSWEET J DEHAVEN P STEPHENSON GB

Citation: La. Clevenger et al., A COMPARISON OF C54-TISI2 FORMATION IN BLANKET AND SUBMICRON GATE STRUCTURES USING IRT SITU X-RAY-DIFFRACTION DURING RAPID THERMAL ANNEALING, Journal of materials research, 10(9), 1995, pp. 2355-2359

Authors: ROY RA CLEVENGER LA CABRAL C SAENGER KL BRAUER S JORDANSWEET J BUCCHIGNANO J STEPHENSON GB MORALES G LUDWIG KF

Citation: Ra. Roy et al., IN-SITU X-RAY-DIFFRACTION ANALYSIS OF THE C49-C54 TITANIUM SILICIDE PHASE-TRANSFORMATION IN NARROW LINES, Applied physics letters, 66(14), 1995, pp. 1732-1734