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Results: 1-10 |
Results: 10
INFLUENCE OF DATA-ANALYSIS AND OTHER FACTORS ON THE SHORT-TERM STABILITY OF VERTICAL SCANNING-PROBE MICROSCOPE CALIBRATION MEASUREMENTS
Authors: EDWARDS H JORGENSEN JF DAGATA J STRAUSSER Y SCHNEIR J
Citation: H. Edwards et al., INFLUENCE OF DATA-ANALYSIS AND OTHER FACTORS ON THE SHORT-TERM STABILITY OF VERTICAL SCANNING-PROBE MICROSCOPE CALIBRATION MEASUREMENTS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(2), 1998, pp. 633-644
2-DIMENSIONAL NANOMETER-SCALE CALIBRATION BASED ON ONE-DIMENSIONAL GRATINGS
Authors: GARNAES J NIELSEN L DIRSCHERL K JORGENSEN JF RASMUSSEN JB LINDELOF PE SORENSEN CB
Citation: J. Garnaes et al., 2-DIMENSIONAL NANOMETER-SCALE CALIBRATION BASED ON ONE-DIMENSIONAL GRATINGS, Applied physics A: Materials science & processing, 66, 1998, pp. 831-835
LATERAL METROLOGY USING SCANNING PROBE MICROSCOPES, 2D PITCH STANDARDS AND IMAGE-PROCESSING
Authors: JORGENSEN JF JENSEN CP GARNAES J
Citation: Jf. Jorgensen et al., LATERAL METROLOGY USING SCANNING PROBE MICROSCOPES, 2D PITCH STANDARDS AND IMAGE-PROCESSING, Applied physics A: Materials science & processing, 66, 1998, pp. 847-852
INTERNATIONAL INTERCOMPARISON OF SCANNING-TUNNELING-MICROSCOPY
Authors: BARBATO G CAMEIRO K CUPPINI D GARNAES J GORI G HUGHES G JENSON CP JORGENSEN JF JUSKO O LIVI S MCQUOID H NIELSEN L PICOTTO GB WILKENING G
Citation: G. Barbato et al., INTERNATIONAL INTERCOMPARISON OF SCANNING-TUNNELING-MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1531-1535
CALIBRATION, DRIFT ELIMINATION, AND MOLECULAR-STRUCTURE ANALYSIS
Authors: JORGENSEN JF MADSEN LL GARNAES J CARNEIRO K SCHAUMBURG K
Citation: Jf. Jorgensen et al., CALIBRATION, DRIFT ELIMINATION, AND MOLECULAR-STRUCTURE ANALYSIS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1698-1701
HYSTERESIS CORRECTION OF SCANNING TUNNELING MICROSCOPE IMAGES
Authors: JORGENSEN JF CARNEIRO K MADSEN LL CONRADSEN K
Citation: Jf. Jorgensen et al., HYSTERESIS CORRECTION OF SCANNING TUNNELING MICROSCOPE IMAGES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1702-1704
DYNAMICS AND STRUCTURE OF SELF-ASSEMBLED ORGANIC-MOLECULES AT THE SOLID-LIQUID INTERFACE
Authors: JORGENSEN JF SCHMEISSER N GARNAES J MADSEN LL SCHAUMBURG K HANSEN L SOMMERLARSEN P
Citation: Jf. Jorgensen et al., DYNAMICS AND STRUCTURE OF SELF-ASSEMBLED ORGANIC-MOLECULES AT THE SOLID-LIQUID INTERFACE, Surface & coatings technology, 67(3), 1994, pp. 201-211
LANGMUIR-BLODGETT-FILMS OF A FUNCTIONALIZED MOLECULE WITH CROSS-SECTIONAL MISMATCH BETWEEN HEAD AND TAIL
Authors: GARNAES J LARSEN NB BJORNHOLM T JORGENSEN M KJAER K ALSNIELSEN J JORGENSEN JF ZASADZINSKI JA
Citation: J. Garnaes et al., LANGMUIR-BLODGETT-FILMS OF A FUNCTIONALIZED MOLECULE WITH CROSS-SECTIONAL MISMATCH BETWEEN HEAD AND TAIL, Science, 264(5163), 1994, pp. 1301-1304
ROUGHNESS OF SMOOTH SURFACES - STM VERSUS PROFILOMETERS
Authors: MADSEN LL JORGENSEN JF CARNEIRO K NIELSEN HS
Citation: Ll. Madsen et al., ROUGHNESS OF SMOOTH SURFACES - STM VERSUS PROFILOMETERS, Metrologia, 30(5), 1994, pp. 513-516
OVERLAYERS OF ORGANIC-MOLECULES ON GRAPHITE STUDIED BY STM
Authors: MADSEN LL JORGENSEN JF CARNEIRO K JORGENSEN M GARNAES J
Citation: Ll. Madsen et al., OVERLAYERS OF ORGANIC-MOLECULES ON GRAPHITE STUDIED BY STM, Synthetic metals, 55(1), 1993, pp. 335-340
Risultati: 1-10 |