Authors: JOUAN PY VANDERBECQ AC DAUCHOT JP WAUTELET M HECQ M

Citation: Py. Jouan et al., STUDY OF AN RF PLANAR MAGNETRON SPUTTERING DISCHARGE WITH LANGMUIR PROBE MEASUREMENTS, Surface & coatings technology, 98(1-3), 1998, pp. 1426-1432

Authors: REMIENS D JABER B JOUAN PY

Citation: D. Remiens et al., GROWTH OF PIEZOELECTRIC THIN-FILMS BY SPUTTERING, Journal de physique. IV, 4(C2), 1994, pp. 107-112

Authors: JOUAN PY LEMPERIERE G

Citation: Py. Jouan et G. Lemperiere, STUDY OF A RF PLANAR MAGNETRON SPUTTERING DISCHARGE - DISCHARGE CHARACTERISTICS AND PLASMA DIAGNOSTICS, Vacuum, 45(1), 1994, pp. 89-95

Authors: JOUAN PY LEMPERIERE G

Citation: Py. Jouan et G. Lemperiere, INFLUENCE OF LOW-ENERGY ION-BOMBARDMENT ON THE PROPERTIES OF TIN FILMS DEPOSITED BY RF MAGNETRON SPUTTERING, Thin solid films, 237(1-2), 1994, pp. 200-207

Authors: JOUAN PY PEIGNON MC CARDINAUD C LEMPERIERE G

Citation: Py. Jouan et al., CHARACTERIZATION OF TIN COATINGS AND OF THE TIN SI INTERFACE BY X-RAYPHOTOELECTRON-SPECTROSCOPY AND AUGER-ELECTRON SPECTROSCOPY/, Applied surface science, 68(4), 1993, pp. 595-603