Authors:
MEYER P
JOUFFROY M
MEMBREY F
FROMM M
CHAMBAUDET A
Citation: P. Meyer et al., PARAMETERS INFLUENCING THE EXISTENCE AND THE OBSERVABILITY OF ETCHED TRACKS - APPLICATION TO ALPHA-PARTICLE DETECTION IN CR-39, Radiation protection dosimetry, 74(1-2), 1997, pp. 75-83
Authors:
GIRE A
JOUFFROY M
THEOBALD JG
BOHNKE O
FRAND G
LACORRE P
Citation: A. Gire et al., A NEW TECHNIQUE TO ASSESS ELECTRICAL BEHAVIOR BY MICROWAVE MEASUREMENTS, APPLICATION TO PEROVSKITES RNIO(3) (R=ND, SM), Journal of physics and chemistry of solids, 58(4), 1997, pp. 577-586