Authors: Skarman, B Wallenberg, LR Jacobsen, SN Helmersson, U Thelander, C

Citation: B. Skarman et al., Evaluation of intermittent contact mode AFM probes by HREM and using atomically sharp CeO2 ridges as tip characterizer, LANGMUIR, 16(15), 2000, pp. 6267-6277

Authors: Jacobsen, SN Madsen, LD Helmersson, U

Citation: Sn. Jacobsen et al., Epitaxial cerium oxide buffer layers and YBa2Cu3O7-delta thin films for microwave device applications, J MATER RES, 14(6), 1999, pp. 2385-2393

Authors: Jacobsen, SN Helmersson, U Erlandsson, R Skarman, B Wallenberg, LR

Citation: Sn. Jacobsen et al., Sharp microfaceting of (001)-oriented cerium dioxide thin films and the effect of annealing on surface morphology, SURF SCI, 429(1-3), 1999, pp. 22-33

Authors: Skarman, B Wallenberg, LR Larsson, PO Andersson, A Bovin, JO Jacobsen, SN Helmersson, U

Citation: B. Skarman et al., Carbon monoxide oxidation on copper oxide thin films supported on corrugated cerium dioxide {111} and {001} surfaces, J CATALYSIS, 181(1), 1999, pp. 6-15