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Results: 1-25 | 26-30 |
Results: 26-30/30
Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES
Authors: Simonsen, AC Pohler, JP Jeynes, C Tougaard, S
Citation: Ac. Simonsen et al., Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES, SURF INT AN, 27(1), 1999, pp. 52-56
Bayesian error analysis of Rutherford backscattering spectra
Authors: Barradas, NP Jeynes, C Jenkin, M Marriott, PK
Citation: Np. Barradas et al., Bayesian error analysis of Rutherford backscattering spectra, THIN SOL FI, 344, 1999, pp. 31-34
Structural analysis of nanocrystalline SiC thin films grown on silicon by ECR plasma CVD
Authors: Toal, SJ Reehal, HS Webb, SJ Barradas, NP Jeynes, C
Citation: Sj. Toal et al., Structural analysis of nanocrystalline SiC thin films grown on silicon by ECR plasma CVD, THIN SOL FI, 344, 1999, pp. 292-294
Profiling chlorine diffusion into ordinary Portland cement and pulverized fuel ash pastes using scanning MeV proton micro-PIXE
Authors: Jenneson, PM Clough, AS Hollands, R Mulheron, MJ Jeynes, C
Citation: Pm. Jenneson et al., Profiling chlorine diffusion into ordinary Portland cement and pulverized fuel ash pastes using scanning MeV proton micro-PIXE, J MAT SCI L, 17(14), 1998, pp. 1173-1175
Erbium in silicon-germanium quantum wells
Authors: Naveed, AT Huda, MQ Abd El-Rahman, KF Hartung, J Evans-Freeman, JH Peaker, AR Houghton, DC Jeynes, C Gillin, WP
Citation: At. Naveed et al., Erbium in silicon-germanium quantum wells, J LUMINESC, 80(1-4), 1998, pp. 381-386
Risultati: 1-25 | 26-30 |