Authors: Ritley, KA Just, KP Schreiber, F Dosch, H Niesen, TP Aldinger, F

Citation: Ka. Ritley et al., X-ray reflectivity study of solution-deposited ZrO2 thin films on self-assembled monolayers: Growth, interface properties, and thermal densification, J MATER RES, 15(12), 2000, pp. 2706-2713