Authors: YASUTAKE M WAKIYAMA S KITAMURA M FUJINO N KARINO I OUMORI M

Citation: M. Yasutake et al., INSTRUMENTATION OF A WAFER INSPECTION LARGE-SAMPLE ATOMIC-FORCE MICROSCOPE, Thin solid films, 282(1-2), 1996, pp. 576-579

Authors: FUJINO N KARINO I KOBAYASHI J KURAMOTO K OHOMORI M YASUTAKE M WAKIYAMA S

Citation: N. Fujino et al., FIRST OBSERVATIONS OF 0.1 MU-M SIZE PARTICLES ON SI WAFERS USING ATOMIC-FORCE MICROSCOPY AND OPTICAL-SCATTERING, Journal of the Electrochemical Society, 143(12), 1996, pp. 4125-4128

Authors: KOHRI S KOBAYASHI J TAHATA S KITA S KARINO I YOKOYAMA T

Citation: S. Kohri et al., MOLECULAR-ORIENTATION IN POLYMER-DISPERSED LIQUID-CRYSTALS USING TIME-RESOLVED FT-IR, Applied spectroscopy, 47(9), 1993, pp. 1367-1369