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Results: 1
A NOVEL METHOD FOR TIME-RESOLVED CHARACTERIZATION OF MICROMAGNETIC STRAY FIELDS WITH SCANNING PROBE MICROSCOPY
Authors:
BANGERT J KASIM S MERTIN W KUBALEK E
Citation:
J. Bangert et al., A NOVEL METHOD FOR TIME-RESOLVED CHARACTERIZATION OF MICROMAGNETIC STRAY FIELDS WITH SCANNING PROBE MICROSCOPY, Surface and interface analysis, 25(7-8), 1997, pp. 533
Risultati:
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