Citation: Dj. Hauck et Jb. Keats, ROBUSTNESS OF THE EXPONENTIAL SEQUENTIAL PROBABILITY RATIO TEST (SPRT) WHEN WEIBULL DISTRIBUTED FAILURES ARE TRANSFORMED USING A KNOWN SHAPE PARAMETER, Microelectronics and reliability, 37(12), 1997, pp. 1835-1840
Citation: C. Lawson et al., COMPARISON OF ROBUST AND LEAST-SQUARES REGRESSION IN COMPUTER-GENERATED PROBABILITY PLOTS, IEEE transactions on reliability, 46(1), 1997, pp. 108-115
Authors:
SCRANTON R
RUNGER GC
KEATS JB
MONTGOMERY DC
Citation: R. Scranton et al., EFFICIENT SHIFT DETECTION USING MULTIVARIATE EXPONENTIALLY-WEIGHTED MOVING AVERAGE CONTROL CHARTS AND PRINCIPAL COMPONENTS, Quality and reliability engineering international, 12(3), 1996, pp. 165-171
Citation: We. Molnau et Jb. Keats, A RULE-BASED APPROACH TO MULTIPLE STATISTICAL TEST ANALYSIS OF BINARYDATA, IIE transactions, 28(3), 1996, pp. 203-213
Citation: Fk. Wang et al., MAXIMUM-LIKELIHOOD-ESTIMATION OF THE BURR-XII PARAMETERS WITH CENSORED AND UNCENSORED DATA, Microelectronics and reliability, 36(3), 1996, pp. 359-362
Citation: Ch. White et Jb. Keats, ARLS AND HIGHER-ORDER RUN-LENGTH MOMENTS FOR THE POISSON CUSUM, Journal of quality technology, 28(3), 1996, pp. 363-369
Citation: Jr. Simpson et Jb. Keats, SENSITIVITY STUDY OF THE CUSUM CONTROL CHART WITH AN ECONOMIC-MODEL, International journal of production economics, 40(1), 1995, pp. 1-19
Citation: Jr. Simpson et Jb. Keats, TRADE-OFF ANALYSIS VERSUS CONSTRAINED OPTIMIZATION WITH AN ECONOMIC-CONTROL CHART MODEL, IIE transactions, 27(6), 1995, pp. 765-772
Citation: Fk. Wang et Jb. Keats, IMPROVED PERCENTILE ESTIMATION FOR THE 2-PARAMETER WEIBULL DISTRIBUTION, Microelectronics and reliability, 35(6), 1995, pp. 883-892
Authors:
SIRUGO G
DUCLOS F
FUJITA R
KEATS JB
PANDOLFO M
MANDEL JL
KOENIG M
Citation: G. Sirugo et al., MAPPING THE FRIEDREICH ATAXIA LOCUS (FRDA) BY LINKAGE DISEQUILIBRIUM ANALYSIS WITH HIGHLY POLYMORPHIC MICROSATELLITES, Biomedicine & pharmacotherapy, 48(5-6), 1994, pp. 219-224
Authors:
MONTGOMERY DC
KEATS JB
RUNGER GC
MESSINA WS
Citation: Dc. Montgomery et al., INTEGRATING STATISTICAL PROCESS-CONTROL AND ENGINEERING PROCESS-CONTROL, Journal of quality technology, 26(2), 1994, pp. 79-87
Citation: Jj. Deely et Jb. Keats, BAYES STOPPING RULES FOR RELIABILITY TESTING WITH THE EXPONENTIAL-DISTRIBUTION (VOL 43, PG 288, 1994), IEEE transactions on reliability, 43(4), 1994, pp. 633-633
Citation: Jj. Deely et Jb. Keats, BAYES STOPPING RULES FOR RELIABILITY TESTING WITH THE EXPONENTIAL-DISTRIBUTION, IEEE transactions on reliability, 43(2), 1994, pp. 288-293