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Results: 1
TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS) STUDY OF SF6 AND SF6-CF4 PLASMA-TREATED LOW-DENSITY POLYETHYLENE FILMS
Authors: LEONARD D BERTRAND P KHAIRALLAHABDELNOUR Y AREFIKHONSARI F AMOUROUX J
Citation: D. Leonard et al., TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS) STUDY OF SF6 AND SF6-CF4 PLASMA-TREATED LOW-DENSITY POLYETHYLENE FILMS, Surface and interface analysis, 23(7-8), 1995, pp. 467-476
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