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Results: 1-11 |
Results: 11
USE OF LASER REFLECTOMETRY FOR END-POINT DETECTION DURING THE ETCHINGOF MAGNETIC THIN-FILMS
Authors: KHAMSEHPOUR B WILKINSON CDW CHAPMAN JN
Citation: B. Khamsehpour et al., USE OF LASER REFLECTOMETRY FOR END-POINT DETECTION DURING THE ETCHINGOF MAGNETIC THIN-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(4), 1997, pp. 2069-2073
HIGH-RESOLUTION PATTERNING OF THIN MAGNETIC-FILMS TO PRODUCE ULTRASMALL MAGNETIC ELEMENTS
Authors: KHAMSEHPOUR B WILKINSON CDW CHAPMAN JN JOHNSTON AB
Citation: B. Khamsehpour et al., HIGH-RESOLUTION PATTERNING OF THIN MAGNETIC-FILMS TO PRODUCE ULTRASMALL MAGNETIC ELEMENTS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(5), 1996, pp. 3361-3366
FOCUSED ION-BEAM MACHINING AND DEPOSITION FOR NANOFABRICATION
Authors: DAVIES ST KHAMSEHPOUR B
Citation: St. Davies et B. Khamsehpour, FOCUSED ION-BEAM MACHINING AND DEPOSITION FOR NANOFABRICATION, Vacuum, 47(5), 1996, pp. 455-462
IN-SITU STUDIES OF THE PROPERTIES OF MICROMETER-SIZED MAGNETIC ELEMENTS BY COHERENT FOUCAULT IMAGING
Authors: JOHNSTON AB CHAPMAN JN KHAMSEHPOUR B WILKINSON CDW
Citation: Ab. Johnston et al., IN-SITU STUDIES OF THE PROPERTIES OF MICROMETER-SIZED MAGNETIC ELEMENTS BY COHERENT FOUCAULT IMAGING, Journal of physics. D, Applied physics, 29(6), 1996, pp. 1419-1427
THE FABRICATION AND MAGNETIC-PROPERTIES OF ACICULAR MAGNETIC NANO-ELEMENTS
Authors: RUHRIG M KHAMSEHPOUR B KIRK KJ CHAPMAN JN AITCHISON P MCVITIE S WILKINSON CDW
Citation: M. Ruhrig et al., THE FABRICATION AND MAGNETIC-PROPERTIES OF ACICULAR MAGNETIC NANO-ELEMENTS, IEEE transactions on magnetics, 32(5), 1996, pp. 4452-4457
FABRICATION OF NIFE THIN-FILM ELEMENTS BY DRY-ETCHING USING CH4 H-2/O-2/
Authors: KHAMSEHPOUR B WILKINSON CDW CHAPMAN JN
Citation: B. Khamsehpour et al., FABRICATION OF NIFE THIN-FILM ELEMENTS BY DRY-ETCHING USING CH4 H-2/O-2/, Applied physics letters, 67(21), 1995, pp. 3194-3196
ANGLE LAPPING OF MULTILAYER STRUCTURES FOR THICKNESS MEASUREMENTS USING FOCUSED ION-BEAM MICROMACHINING
Authors: KHAMSEHPOUR B DAVIES ST
Citation: B. Khamsehpour et St. Davies, ANGLE LAPPING OF MULTILAYER STRUCTURES FOR THICKNESS MEASUREMENTS USING FOCUSED ION-BEAM MICROMACHINING, Semiconductor science and technology, 9(3), 1994, pp. 249-255
MAGNETO-TUNNELING IN A DOUBLE-BARRIER STRUCTURE WITH SUPERLATTICE ENERGY FILTERS
Authors: PRITCHARD RE HARNESS PC KHAMSEHPOUR B SINGER KE MAUDE DK PORTAL JC
Citation: Re. Pritchard et al., MAGNETO-TUNNELING IN A DOUBLE-BARRIER STRUCTURE WITH SUPERLATTICE ENERGY FILTERS, Semiconductor science and technology, 9(2), 1994, pp. 174-177
MICROMACHINING OF SEMICONDUCTOR-MATERIALS BY FOCUSED ION-BEAMS
Authors: KHAMSEHPOUR B DAVIES ST
Citation: B. Khamsehpour et St. Davies, MICROMACHINING OF SEMICONDUCTOR-MATERIALS BY FOCUSED ION-BEAMS, Vacuum, 45(12), 1994, pp. 1169-1173
END-POINT DETECTION USING ABSORBED CURRENT, SECONDARY-ELECTRON, AND SECONDARY ION SIGNALS DURING MILLING OF MULTILAYER STRUCTURES BY FOCUSED ION-BEAM
Authors: DAVIES ST KHAMSEHPOUR B
Citation: St. Davies et B. Khamsehpour, END-POINT DETECTION USING ABSORBED CURRENT, SECONDARY-ELECTRON, AND SECONDARY ION SIGNALS DURING MILLING OF MULTILAYER STRUCTURES BY FOCUSED ION-BEAM, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(2), 1993, pp. 263-267
INVESTIGATION OF RESONANT TUNNELING FROM MINIBAND EMITTER STATES IN DOUBLE BARRIER STRUCTURES BASED ON (ALGA)AS GAAS USING HIGH MAGNETIC-FIELDS/
Authors: PRITCHARD RE HARNESS PC CURY L PORTAL JC KHAMSEHPOUR B TRUSCOTT WS SINGER KE
Citation: Re. Pritchard et al., INVESTIGATION OF RESONANT TUNNELING FROM MINIBAND EMITTER STATES IN DOUBLE BARRIER STRUCTURES BASED ON (ALGA)AS GAAS USING HIGH MAGNETIC-FIELDS/, Semiconductor science and technology, 6(7), 1991, pp. 626-630
Risultati: 1-11 |