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Results: 1-14 |
Results: 14
LOW-TEMPERATURE ATTACHMENT FOR TEMPERATURES DOWN TO 120 K FOR A DIFFRACTOMETER WITH A 2-DIMENSIONAL DETECTOR
Authors: RUSAKOV AA KHEIKER DM
Citation: Aa. Rusakov et Dm. Kheiker, LOW-TEMPERATURE ATTACHMENT FOR TEMPERATURES DOWN TO 120 K FOR A DIFFRACTOMETER WITH A 2-DIMENSIONAL DETECTOR, Crystallography reports, 43(1), 1998, pp. 134-136
NH4SCN-NH4CL AND NASCN-NH4SCN SYSTEMS STU DY BY POWDER X-RAY-DIFFRACTION AT ROOM-TEMPERATURE
Authors: DOLBININA VV SAVENKO BN SMIRNOV LS SOLOVYEV AI SULYANOV SN KHEIKER DM SHUVALOV LA
Citation: Vv. Dolbinina et al., NH4SCN-NH4CL AND NASCN-NH4SCN SYSTEMS STU DY BY POWDER X-RAY-DIFFRACTION AT ROOM-TEMPERATURE, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 60(10), 1996, pp. 202-204
A STUDY OF PARAMETERS OF AN SD-1000 AREA DETECTOR WITH A SPHERICAL INPUT WINDOW
Authors: KHEIKER DM ANDRIYANOVA ME SULYANOV SN ZANEVSKII YV FATEEV OV CHERNENKO SP
Citation: Dm. Kheiker et al., A STUDY OF PARAMETERS OF AN SD-1000 AREA DETECTOR WITH A SPHERICAL INPUT WINDOW, Kristallografia, 41(2), 1996, pp. 362-369
MEASUREMENTS OF ANGULAR COORDINATES BY AN SD-1000 DETECTOR WITH SPHERICAL DRIFT REGION
Authors: SULYANOV SN ANDRIYANOVA ME KHEIKER DM
Citation: Sn. Sulyanov et al., MEASUREMENTS OF ANGULAR COORDINATES BY AN SD-1000 DETECTOR WITH SPHERICAL DRIFT REGION, Kristallografia, 41(2), 1996, pp. 370-375
PARALLAX-FREE X-RAY AREA DETECTOR WITH HIGH-SPATIAL-RESOLUTION
Authors: ZANEVSKY YV CHERNENKO SP CHEREMUKHINA GA DONETS DE FATEEV OV SMYKOV LP VASILIEV SE KHEIKER DM ANDRIANOVA ME SULIANOV SN
Citation: Yv. Zanevsky et al., PARALLAX-FREE X-RAY AREA DETECTOR WITH HIGH-SPATIAL-RESOLUTION, Nuclear physics. B, 1995, pp. 406-408
TEST-RESULTS OF THE PARALLAX-FREE X-RAY AREA DETECTOR SD-1000 IN THE DIFFRACTOMETER CARD-7
Authors: ZANEVSKY YV CHERNENKO SP CHEREMUKHINA GA FATEEV OV KHEIKER DM ANDRIANOVA ME SULIANOV SN
Citation: Yv. Zanevsky et al., TEST-RESULTS OF THE PARALLAX-FREE X-RAY AREA DETECTOR SD-1000 IN THE DIFFRACTOMETER CARD-7, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 367(1-3), 1995, pp. 76-78
THE USE OF AN AREA-DETECTOR X-RAY DIFFRAC TOMETER IN THE RIETVELD METHOD
Authors: SULYANOV SN BURENKOV GP KHEIKER DM
Citation: Sn. Sulyanov et al., THE USE OF AN AREA-DETECTOR X-RAY DIFFRAC TOMETER IN THE RIETVELD METHOD, Kristallografia, 40(2), 1995, pp. 234-238
X-RAY-DETECTORS FOR STRUCTURE INVESTIGATIONS CONSTRUCTED AT JINR
Authors: CHERNENKO SP CHEREMUKHINA GA FATEEV OV SMYKOV LP VASILIEV SE ZANEVSKY YV KHEIKER DM POPOV AN
Citation: Sp. Chernenko et al., X-RAY-DETECTORS FOR STRUCTURE INVESTIGATIONS CONSTRUCTED AT JINR, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 348(2-3), 1994, pp. 261-263
ON THE SIZES OF SPOTS IN LAUE PATTERNS
Authors: RUBINSKII SV KHEIKER DM
Citation: Sv. Rubinskii et Dm. Kheiker, ON THE SIZES OF SPOTS IN LAUE PATTERNS, Kristallografia, 39(4), 1994, pp. 732-733
METHODS OF MEASURING X-RAY-DIFFRACTION IN TENSITIES FOR MACROMOLECULAR SINGLE-CRYSTALS USING A KARD-6 MULTIWIRE AREA DETECTOR X-RAY DIFFRACTOMETER
Authors: POPOV AN ANDRIANOVA ME BURENKOV GP KHEIKER DM
Citation: An. Popov et al., METHODS OF MEASURING X-RAY-DIFFRACTION IN TENSITIES FOR MACROMOLECULAR SINGLE-CRYSTALS USING A KARD-6 MULTIWIRE AREA DETECTOR X-RAY DIFFRACTOMETER, Kristallografia, 39(3), 1994, pp. 415-421
USING A 2-DIMENSIONAL DETECTOR FOR X-RAY-POWDER DIFFRACTOMETRY
Authors: SULYANOV SN POPOV AN KHEIKER DM
Citation: Sn. Sulyanov et al., USING A 2-DIMENSIONAL DETECTOR FOR X-RAY-POWDER DIFFRACTOMETRY, Journal of applied crystallography, 27, 1994, pp. 934-942
STABLE NITROGEN LOW-TEMPERATURE ATTACHMEN T FOR AUTOMATIC DIFFRACTOMETERS
Authors: RUSAKOV AA DOBRYNIN GI KHEIKER DM
Citation: Aa. Rusakov et al., STABLE NITROGEN LOW-TEMPERATURE ATTACHMEN T FOR AUTOMATIC DIFFRACTOMETERS, Kristallografia, 38(4), 1993, pp. 241-247
SCANNING INTERVAL AND DIMENSIONS OF DIFFR ACTION SPOTS IN A GENERAL-CASE OF INCLINE GEOMETRY WITH REGARD TO ANISOTROPY OF INITIAL BEAM PATCHINESS AND DIVERGENCE
Authors: RUBINSKII SV KHEIKER DM
Citation: Sv. Rubinskii et Dm. Kheiker, SCANNING INTERVAL AND DIMENSIONS OF DIFFR ACTION SPOTS IN A GENERAL-CASE OF INCLINE GEOMETRY WITH REGARD TO ANISOTROPY OF INITIAL BEAM PATCHINESS AND DIVERGENCE, Kristallografia, 38(3), 1993, pp. 49-57
2-DIMENSIONAL MULTIPLE-WIRE HIGH-RESOLUTION DETECTOR FOR THE X-RAY DIFFRACTOMETER
Authors: ZANEVSKII YV DONETS DE IVANOV AB MOVCHAN SA OSTROVNOI AI CHERNENKO SP KHEIKER DM ANDRIANOVA ME POPOV AN SULYANOV SN
Citation: Yv. Zanevskii et al., 2-DIMENSIONAL MULTIPLE-WIRE HIGH-RESOLUTION DETECTOR FOR THE X-RAY DIFFRACTOMETER, Kristallografia, 38(2), 1993, pp. 252-260
Risultati: 1-14 |