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Results: 1-7 |
Results: 7
QUANTITATIVE MEASUREMENT OF DISPLACEMENT AND STRAIN FIELDS FROM HREM MICROGRAPHS
Authors: HYTCH MJ SNOECK E KILAAS R
Citation: Mj. Hytch et al., QUANTITATIVE MEASUREMENT OF DISPLACEMENT AND STRAIN FIELDS FROM HREM MICROGRAPHS, Ultramicroscopy, 74(3), 1998, pp. 131-146
QUANTITATIVE-ANALYSIS OF STRAIN FIELD IN THIN-FILMS FROM HRTEM MICROGRAPHS
Authors: SNOECK E WAROT B ARDHUIN H ROCHER A CASANOVE MJ KILAAS R HYTCH MJ
Citation: E. Snoeck et al., QUANTITATIVE-ANALYSIS OF STRAIN FIELD IN THIN-FILMS FROM HRTEM MICROGRAPHS, Thin solid films, 319(1-2), 1998, pp. 157-162
OPTIMAL AND NEAR-OPTIMAL FILTERS IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
Authors: KILAAS R
Citation: R. Kilaas, OPTIMAL AND NEAR-OPTIMAL FILTERS IN HIGH-RESOLUTION ELECTRON-MICROSCOPY, Journal of Microscopy, 190, 1998, pp. 45-51
FERROELECTRIC DOMAIN-WALLS IN BATIO3 - FINGERPRINTS IN XRPD DIAGRAMS AND QUANTITATIVE HRTEM IMAGE-ANALYSIS
Authors: FLOQUET N VALOT CM MESNIER MT NIEPCE JC NORMAND L THOREL A KILAAS R
Citation: N. Floquet et al., FERROELECTRIC DOMAIN-WALLS IN BATIO3 - FINGERPRINTS IN XRPD DIAGRAMS AND QUANTITATIVE HRTEM IMAGE-ANALYSIS, Journal de physique. III, 7(6), 1997, pp. 1105-1128
A PATTERN-RECOGNITION TECHNIQUE FOR THE ANALYSIS OF GRAIN-BOUNDARY STRUCTURE BY HREM
Authors: PACIORNIK S KILAAS R TURNER J DAHMEN U
Citation: S. Paciornik et al., A PATTERN-RECOGNITION TECHNIQUE FOR THE ANALYSIS OF GRAIN-BOUNDARY STRUCTURE BY HREM, Ultramicroscopy, 62(1-2), 1996, pp. 15-27
QUANTIFICATION OF THE MODULATED STRUCTURES IN TIPDCR ALLOYS
Authors: SCHWARTZ AJ PACIORNIK S KILAAS R TANNER LE
Citation: Aj. Schwartz et al., QUANTIFICATION OF THE MODULATED STRUCTURES IN TIPDCR ALLOYS, Journal of Microscopy, 180, 1995, pp. 51-60
ASSESSMENT OF SPECIMEN NOISE IN HREM IMAGES OF SIMPLE STRUCTURES
Authors: PACIORNIK S KILAAS R DAHMEN U
Citation: S. Paciornik et al., ASSESSMENT OF SPECIMEN NOISE IN HREM IMAGES OF SIMPLE STRUCTURES, Ultramicroscopy, 50(3), 1993, pp. 255-262
Risultati: 1-7 |