Authors: KIM SWA MENBERU B LE HXP JIANG WJ CHUNG JE

Citation: Swa. Kim et al., AN IMPROVED NMOS AC HOT-CARRIER LIFETIME PREDICTION ALGORITHM-BASED ON THE DOMINANT DEGRADATION ASYMPTOTE, I.E.E.E. transactions on electron devices, 44(4), 1997, pp. 651-658