Authors: SCHRODER DK FUNG MS VERKUIL RL PANDEY S HOWLAND WH KLEEFSTRA M

Citation: Dk. Schroder et al., CORONA-OXIDE-SEMICONDUCTOR DEVICE CHARACTERIZATION, Solid-state electronics, 42(4), 1998, pp. 505-512

Authors: HORNER GS KLEEFSTRA M MILLER TG PETERS MA

Citation: Gs. Horner et al., MONITORING ELECTRICALLY ACTIVE CONTAMINANTS TO ASSESS OXIDE QUALITY, Solid state technology, 38(6), 1995, pp. 79