Authors: THIEMANN S HARTUNG R WULFF H KLIMKE J MOBIUS HH GUTH U SCHONAUER U

Citation: S. Thiemann et al., MODIFIED AU YSZ ELECTRODES - PREPARATION, CHARACTERIZATION AND ELECTRODE BEHAVIOR AT HIGHER TEMPERATURES/, Solid state ionics, 86-8, 1996, pp. 873-876

Authors: WULFF H KLIMKE J GEROVA E

Citation: H. Wulff et al., CHARACTERIZATION OF MGO LAYERS ON DIFFERENT ALUMINA AND GLASS SUBSTRATES BY GRAZING-INCIDENCE DIFFRACTOMETRY AND GRAZING-INCIDENCE X-RAY REFLECTOMETRY, Surface and interface analysis, 23(3), 1995, pp. 148-154

Authors: WULFF H KLIMKE J STEFFEN H EGGS C

Citation: H. Wulff et al., INVESTIGATION OF THE TITANIUM SILICIDE FORMATION IN PLASMA ACTIVATED PHYSICAL VAPOR-DEPOSITION, Thin solid films, 261(1-2), 1995, pp. 25-30

Authors: KLIMKE J WULFF H

Citation: J. Klimke et H. Wulff, DETERMINATION OF THE OPTIMUM EU3-CONCENTRATION IN LAALO3 - EU-PHOSPHORS BY X-RAY-DIFFRACTION AND FLUORESCENCE MEASUREMENTS(), Fresenius' journal of analytical chemistry, 349(1-3), 1994, pp. 245-246