Authors:
KRAWCZYK SK
GENDRY M
KLINGELHOFER C
VENET T
BUCHHEIT M
BLANCHET R
HOLLINGER G
Citation: Sk. Krawczyk et al., APPLICATION OF SPECTRALLY RESOLVED SCANNING PHOTOLUMINESCENCE TO ASSESS RELAXATION PROCESSES OF INGAAS AND INALAS LAYERS STRAINED IN COMPRESSION AND TENSION, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 146-152
Authors:
SCHOHE K
KRAFFT F
KLINGELHOFER C
GARRIGUES M
KRAWCZYK SK
WEYHER J
Citation: K. Schohe et al., RECENT ADVANCES IN THE ASSESSMENT OF GAAS SUBSTRATE QUALITY BY SCANNING PHOTOLUMINESCENCE, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 121-127