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Authors: KRAWCZYK SK GENDRY M KLINGELHOFER C VENET T BUCHHEIT M BLANCHET R HOLLINGER G
Citation: Sk. Krawczyk et al., APPLICATION OF SPECTRALLY RESOLVED SCANNING PHOTOLUMINESCENCE TO ASSESS RELAXATION PROCESSES OF INGAAS AND INALAS LAYERS STRAINED IN COMPRESSION AND TENSION, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 146-152

Authors: SCHOHE K KRAFFT F KLINGELHOFER C GARRIGUES M KRAWCZYK SK WEYHER J
Citation: K. Schohe et al., RECENT ADVANCES IN THE ASSESSMENT OF GAAS SUBSTRATE QUALITY BY SCANNING PHOTOLUMINESCENCE, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 121-127
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