Authors: KASUMOV AY KONONENKO OV MATVEEV VN BORSENKO TB TULIN VA VDOVIN EE KHODOS II

Citation: Ay. Kasumov et al., ANOMALOUS PROXIMITY EFFECT IN THE NB-BISB-NB JUNCTIONS, Physical review letters, 77(14), 1996, pp. 3029-3032

Authors: ARISTOV VV KASUMOV AY KISLOV NA KONONENKO OV MATVEEV VN TULIN VA KHODOS II GORBATOV YA NIKOLAICHIK VI

Citation: Vv. Aristov et al., A NEW APPROACH TO FABRICATION OF NANOSTRUCTURES, Nanotechnology, 6(2), 1995, pp. 35-39

Authors: KONONENKO OV IVANOV ED MATVEEV VN KHODOS II

Citation: Ov. Kononenko et al., ELECTROMIGRATION ACTIVATION-ENERGY IN PURE ALUMINUM FILMS DEPOSITED BY PARTIALLY-IONIZED BEAM TECHNIQUE, Scripta metallurgica et materialia, 33(12), 1995, pp. 1981-1986

Authors: KONONENKO OV MATVEEV VN KASUMOV AY KISLOV NA KHODOS II

Citation: Ov. Kononenko et al., THE EFFECT OF SELF-IONS BOMBARDMENT ON THE STRUCTURE AND PROPERTIES OF THIN METAL-FILMS, Vacuum, 46(7), 1995, pp. 685-690

Authors: KASUMOV AY KHODOS II KISLOV NA KONONENKO OV MATVEEV VN TULIN VA GORBATOV YB NIKOLAICHIK VI VDOVIN EE

Citation: Ay. Kasumov et al., GIANT PEAKS OF THE CONDUCTANCE IN POLYCRYSTALLINE BI NANOBRIDGES, Physical review letters, 75(23), 1995, pp. 4286-4289

Authors: FIONOVA LK KONONENKO OV MATVEEV VN

Citation: Lk. Fionova et al., THE STRUCTURE AND ELECTROMIGRATION BEHAVIOR OF ALUMINUM FILMS DEPOSITED BY THE PARTIALLY IONIZED BEAM TECHNIQUE, Thin solid films, 227(1), 1993, pp. 54-58