Authors:
HEBERT KJ
ZAFAR S
IRENE EA
KUEHN R
MCCARTHY TE
DEMIRLIOGLU EK
Citation: Kj. Hebert et al., MEASUREMENT OF THE REFRACTIVE-INDEX OF THIN SIO2-FILMS USING TUNNELING CURRENT OSCILLATIONS AND ELLIPSOMETRY, Applied physics letters, 68(2), 1996, pp. 266-268
Authors:
ZAFAR S
CONRAD KA
LIU Q
IRENE EA
HAMES G
KUEHN R
WORTMAN JJ
Citation: S. Zafar et al., THICKNESS AND EFFECTIVE ELECTRON MASS MEASUREMENTS FOR THIN SILICON DIOXIDE FILMS USING TUNNELING CURRENT OSCILLATIONS, Applied physics letters, 67(7), 1995, pp. 1031-1033