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Results: 1
DEFECTS IN GE-IMPLANTED SI STUDIED BY SLOW POSITRON IMPLANTATION SPECTROSCOPY()
Authors:
KUNA SAE COLEMAN PG NEJIM A CRISTIANO F HEMMENT PLF
Citation:
Sae. Kuna et al., DEFECTS IN GE-IMPLANTED SI STUDIED BY SLOW POSITRON IMPLANTATION SPECTROSCOPY(), Semiconductor science and technology, 13(4), 1998, pp. 394-398
Risultati:
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