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Results:
1-9
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Results: 9
Authors:
Tok, ES
Zhang, J
Kamiya, I
Xie, MH
Neave, JH
Joyce, BA
Citation: Es. Tok et al., Missing "sheets" in the reciprocal space representation of the disordered surface with one-dimensional domain boundaries, SURF REV L, 8(5), 2001, pp. 509-511
Authors:
Abu-Jabal, MS
Kamiya, I
Narasaki, Y
Citation: Ms. Abu-jabal et al., Proving test for a solar-powered desalination system in Gaza-Palestine, DESALINATN, 137(1-3), 2001, pp. 1-6
Authors:
Yamamoto, H
Takahashi, T
Kamiya, I
Citation: H. Yamamoto et al., Local capacitance measurements on InAs dot-covered GaAs surfaces by scanning capacitance microscopy, APPL PHYS L, 77(13), 2000, pp. 1994-1996
Authors:
Yamamoto, H
Kamiya, I
Takahashi, T
Citation: H. Yamamoto et al., Photoinduced current properties of InAs-covered GaAs studied by scanning tunneling microscopy, JPN J A P 1, 38(6B), 1999, pp. 3871-3874
Authors:
Takahashi, T
Kawamukai, T
Kamiya, I
Citation: T. Takahashi et al., Characterization of InAs dots on n-GaAs by AFM with a conductive tip, SURF INT AN, 27(5-6), 1999, pp. 547-549
Authors:
Kamiya, I
Tanaka, I
Sakaki, H
Citation: I. Kamiya et al., Control of size and density of self-assembled InAs dots on (001)GaAs and the dot size dependent capping process, J CRYST GR, 202, 1999, pp. 1146-1149
Authors:
Tanaka, I
Kamiya, I
Sakaki, H
Citation: I. Tanaka et al., Local surface band modulation with MBE-grown InAs quantum dots measured byatomic force microscopy with conductive tip, J CRYST GR, 202, 1999, pp. 1194-1197
Authors:
Takahashi, T
Kawamukai, T
Kamiya, I
Citation: T. Takahashi et al., Electrostatic force characterization on InAs dot-covered n-type (001) GaAssurfaces by contact-mode atomic force microscopy with a conductive tip, APPL PHYS L, 75(4), 1999, pp. 510-512
Authors:
Tanaka, I
Kamiya, I
Sakaki, H
Qureshi, N
Allen, SJ
Petroff, PM
Citation: I. Tanaka et al., Imaging and probing electronic properties of self-assembled InAs quantum dots by atomic force microscopy with conductive tip, APPL PHYS L, 74(6), 1999, pp. 844-846
Risultati:
1-9
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