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Results:
1-5
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Results: 5
The leakage current improvement in an ultrashallow junction NMOS with Co silicided source and drain
Authors:
Kang, WT Kim, JS Lee, KY Shin, YC Kim, TH Park, YJ Park, JW
Citation:
Wt. Kang et al., The leakage current improvement in an ultrashallow junction NMOS with Co silicided source and drain, IEEE ELEC D, 21(1), 2000, pp. 9-11
Low resistance small metal contact for high temperature application
Authors:
Kim, JS Kang, WT Lee, WS Yoo, BY Shin, YC Kim, TH Lee, KY Park, YJ Park, JW
Citation:
Js. Kim et al., Low resistance small metal contact for high temperature application, J VAC SCI B, 17(6), 1999, pp. 2559-2564
The 1997 presidential election in South Korea
Authors:
Kang, WT Jaung, H
Citation:
Wt. Kang et H. Jaung, The 1997 presidential election in South Korea, ELECT STUD, 18(4), 1999, pp. 599-608
Prevention of adhesion failure of a W/TiN/Ti(Co) layer on SiO2
Authors:
Kim, JS Shin, YC Lee, KT Kang, WT Kim, TH Lee, KY Park, YJ Park, JW
Citation:
Js. Kim et al., Prevention of adhesion failure of a W/TiN/Ti(Co) layer on SiO2, THIN SOL FI, 352(1-2), 1999, pp. 128-132
Improving amplifier stability through resistive loading below the operating frequency
Authors:
Kim, SW Chang, IS Kang, WT Kyung, IP
Citation:
Sw. Kim et al., Improving amplifier stability through resistive loading below the operating frequency, IEEE MICR T, 47(3), 1999, pp. 359-362
Risultati:
1-5
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