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Results: 1-3 |
Results: 3

Authors: Ozdemir, O Atilgan, I Katircioglu, B
Citation: O. Ozdemir et al., Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses, J NON-CRYST, 296(1-2), 2001, pp. 27-38

Authors: Akaoglu, B Atilagan, I Katircioglu, B
Citation: B. Akaoglu et al., Correlation between optical path modulations and transmittance spectra of a-Si : H thin films, APPL OPTICS, 39(10), 2000, pp. 1611-1616

Authors: Atilgan, I Ozder, S Ozdemir, O Katircioglu, B
Citation: I. Atilgan et al., Admittance analysis of an MIS structure made with PECVD deposited a-SiNx :H thin films, J NON-CRYST, 249(2-3), 1999, pp. 131-144
Risultati: 1-3 |