Citation: O. Ozdemir et al., Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses, J NON-CRYST, 296(1-2), 2001, pp. 27-38
Citation: B. Akaoglu et al., Correlation between optical path modulations and transmittance spectra of a-Si : H thin films, APPL OPTICS, 39(10), 2000, pp. 1611-1616
Authors:
Atilgan, I
Ozder, S
Ozdemir, O
Katircioglu, B
Citation: I. Atilgan et al., Admittance analysis of an MIS structure made with PECVD deposited a-SiNx :H thin films, J NON-CRYST, 249(2-3), 1999, pp. 131-144