Authors:
Keller-Flaig, RM
Legros, M
Sigle, W
Gouldstone, A
Hemker, KJ
Suresh, S
Arzt, E
Citation: Rm. Keller-flaig et al., In situ transmission electron microscopy investigation of threading dislocation motion in passivated thin aluminum films, J MATER RES, 14(12), 1999, pp. 4673-4676