Authors: Kempenaers, L De Koster, C Van Borm, W Janssens, K

Citation: L. Kempenaers et al., Micro-heterogeneity study of trace elements in BCR CRM 680 by means of synchrotron micro-XRF, FRESEN J AN, 369(7-8), 2001, pp. 733-737

Authors: Kempenaers, L Bings, NH Jeffries, TE Vekemans, B Janssens, K

Citation: L. Kempenaers et al., The use of LA-ICP-MS for the characterization of the micro-heterogeneity of heavy metals in BCR CRM 680, J ANAL ATOM, 16(9), 2001, pp. 1006-1011

Authors: Kempenaers, L Vincze, L Janssens, K

Citation: L. Kempenaers et al., The use of synchrotron micro-XRF for characterization of the micro-heterogeneity of heavy metals in low-Z reference materials, SPECT ACT B, 55(6), 2000, pp. 651-669