Authors:
White, H
Pu, Y
Rafailovich, M
Sokolov, J
King, AH
Giannuzzi, LA
Urbanik-Shannon, C
Kempshall, BW
Eisenberg, A
Schwarz, SA
Strzhemeckny, YM
Citation: H. White et al., Focused ion beam/lift-out transmission electron microscopy cross sections of block copolymer films ordered on silicon substrates, POLYMER, 42(4), 2001, pp. 1613-1619