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Results:
1-7
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Results: 7
Via and embedded resistor formation by matrix-assisted pulsed laser deposition
Authors:
Gilbert, JM Elliner, GR Key, PH Harrey, P Ramsey, B Harrison, D
Citation:
Jm. Gilbert et al., Via and embedded resistor formation by matrix-assisted pulsed laser deposition, P I MEC E B, 214(9), 2000, pp. 837-839
Optical characterisation of pulsed laser deposited SiC films
Authors:
Schlaf, M Sands, D Key, PH
Citation:
M. Schlaf et al., Optical characterisation of pulsed laser deposited SiC films, APPL SURF S, 154, 2000, pp. 83-88
Infra-red reflectivity of ion-implanted and pulsed excimer laser irradiated 4H-SiC
Authors:
Key, PH Sands, D Schlaf, M Walton, CD Anthony, CJ Brunson, KM Uren, MJ
Citation:
Ph. Key et al., Infra-red reflectivity of ion-implanted and pulsed excimer laser irradiated 4H-SiC, THIN SOL FI, 364(1-2), 2000, pp. 200-203
Plasma ignition thresholds in UV laser ablation plumes
Authors:
Clarke, P Dyer, PE Key, PH Snelling, HV
Citation:
P. Clarke et al., Plasma ignition thresholds in UV laser ablation plumes, APPL PHYS A, 69, 1999, pp. S117-S120
A comparative study of the effects of laser wavelength on laser removal ofchlorinated rubber
Authors:
Schmidt, MJJ Li, L Spencer, JT Key, PH
Citation:
Mjj. Schmidt et al., A comparative study of the effects of laser wavelength on laser removal ofchlorinated rubber, APPL SURF S, 139, 1999, pp. 418-423
Ion beam analysis of pulsed laser deposited Ti : sapphire
Authors:
Key, PH Kral, J Schmidt, MJJ
Citation:
Ph. Key et al., Ion beam analysis of pulsed laser deposited Ti : sapphire, APPL SURF S, 139, 1999, pp. 503-506
Evidence for a thermal mechanism in excimer laser ablation of thin film ZnS on Si
Authors:
Sands, D Wagner, FX Key, PH
Citation:
D. Sands et al., Evidence for a thermal mechanism in excimer laser ablation of thin film ZnS on Si, J APPL PHYS, 85(7), 1999, pp. 3855-3859
Risultati:
1-7
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