Authors: Balmer, RS Pickering, C Kier, AM Birbeck, JCH Saker, M Martin, T

Citation: Rs. Balmer et al., In situ optical monitoring of AlGaN thickness and composition during MOVPEgrowth of AlGaN/GaN microwave HFETs, J CRYST GR, 230(3-4), 2001, pp. 361-367