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Results:
1-2
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Results: 2
Authors:
Franta, D
Ohlidal, I
Klapetek, P
Pokorny, P
Ohlidal, M
Citation: D. Franta et al., Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy, SURF INT AN, 32(1), 2001, pp. 91-94
Authors:
Franta, D
Ohlidal, I
Klapetek, P
Citation: D. Franta et al., Analysis of slightly rough thin films by optical methods and AFM, MIKROCH ACT, 132(2-4), 2000, pp. 443-447
Risultati:
1-2
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