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Results: 1-9 |
Results: 9
Crystallisation of Ge nanoclusters in SiO2 caused by electron irradiation in TEM
Authors: Klimenkov, M Matz, W Nepijko, SA Lehmann, M
Citation: M. Klimenkov et al., Crystallisation of Ge nanoclusters in SiO2 caused by electron irradiation in TEM, NUCL INST B, 179(2), 2001, pp. 209-214
Phenomenological model of reactive r.f.-magnetron sputtering of Si in Ar/O-2 atmosphere for the prediction of SiOx thin film stoichiometry from process parameters
Authors: Seifarth, H Schmidt, JU Grotzschel, R Klimenkov, M
Citation: H. Seifarth et al., Phenomenological model of reactive r.f.-magnetron sputtering of Si in Ar/O-2 atmosphere for the prediction of SiOx thin film stoichiometry from process parameters, THIN SOL FI, 389(1-2), 2001, pp. 108-115
The study of Ti doped ZSM-5 particles and cavities inside them
Authors: Klimenkov, M Nepijko, SA Matz, W Bao, X
Citation: M. Klimenkov et al., The study of Ti doped ZSM-5 particles and cavities inside them, J CRYST GR, 231(4), 2001, pp. 577-588
Local melting of the NiAl substrate under deposited Pd clusters during irradiation in a transmission electron microscope
Authors: Nepijko, SA Klimenkov, M Kuhlenbeck, H Freund, HJ
Citation: Sa. Nepijko et al., Local melting of the NiAl substrate under deposited Pd clusters during irradiation in a transmission electron microscope, CRYST RES T, 35(6-7), 2000, pp. 745-749
In situ observation of electron-beam-induced ripening of Ge clusters in thin SiO2 layers
Authors: Klimenkov, M Matz, W von Borany, J
Citation: M. Klimenkov et al., In situ observation of electron-beam-induced ripening of Ge clusters in thin SiO2 layers, NUCL INST B, 168(3), 2000, pp. 367-374
Characterization of crystallinity of SiC surface layers produced by ion implantation
Authors: Theodossiu, E Baumann, H Klimenkov, M Matz, W Bethge, K
Citation: E. Theodossiu et al., Characterization of crystallinity of SiC surface layers produced by ion implantation, PHYS ST S-A, 182(2), 2000, pp. 653-660
Structural investigation of palladium clusters on gamma-AlO3(111)/NiAl(110) with transmission electron microscopy
Authors: Nepijko, SA Klimenkov, M Adelt, M Kuhlenbeck, H Schlogl, R Freund, HJ
Citation: Sa. Nepijko et al., Structural investigation of palladium clusters on gamma-AlO3(111)/NiAl(110) with transmission electron microscopy, LANGMUIR, 15(16), 1999, pp. 5309-5313
Transmission electron microscopy study of platinum clusters on Al2O3/NiAl(110) under the influence of electron irradiation
Authors: Nepijko, SA Klimenkov, M Kuhlenbeck, H Freund, HJ
Citation: Sa. Nepijko et al., Transmission electron microscopy study of platinum clusters on Al2O3/NiAl(110) under the influence of electron irradiation, J VAC SCI A, 17(2), 1999, pp. 577-583
Ion beam synthesis of narrow Ge nanocluster bands in thin SiO2 films
Authors: von Borany, J Heinig, KH Grotzschel, R Klimenkov, M Strobel, M Stegemann, KH Thees, HJ
Citation: J. Von Borany et al., Ion beam synthesis of narrow Ge nanocluster bands in thin SiO2 films, MICROEL ENG, 48(1-4), 1999, pp. 231-234
Risultati: 1-9 |