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Results:
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Results: 1
Photoelastic characterization of residual strain in GaAs wafers annealed in holders of different geometry
Authors:
Herms, M Fukuzawa, M Yamada, M Klober, J Zychowitz, G Niklas, JR
Citation:
M. Herms et al., Photoelastic characterization of residual strain in GaAs wafers annealed in holders of different geometry, MAT SCI E B, 66(1-3), 1999, pp. 7-10
Risultati:
1-1
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