Authors: Kochowski, S Paszkiewicz, B Paszkiewicz, R

Citation: S. Kochowski et al., Some effects of (NH4)(2)S-x treatment of n-GaAs surface on electrical characteristics of metal-SiO2-GaAs structures, VACUUM, 57(2), 2000, pp. 157-162

Authors: Kochowski, S Nowak, M

Citation: S. Kochowski et M. Nowak, An analysis of small-signal response of the SiO2-(n) GaAs interface based on a surface disorder model, VACUUM, 54(1-4), 1999, pp. 183-188

Authors: Kochowski, S Nitsch, K Paszkiewicz, R

Citation: S. Kochowski et al., Electrical properties of SiO2-(n) GaAs interface on the basis of measurements of MIS structure capacitance and conductance, THIN SOL FI, 348(1-2), 1999, pp. 180-187