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Results: 1
Constant-resistance deep-level transient spectroscopy in Si and Ge JFET's
Authors:
Kolev, PV Deen, MJ Kierstead, J Citterio, M
Citation:
Pv. Kolev et al., Constant-resistance deep-level transient spectroscopy in Si and Ge JFET's, IEEE DEVICE, 46(1), 1999, pp. 204-213
Risultati:
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