Authors:
Shen, YL
Jacobs, DB
Malliaras, GG
Koley, G
Spencer, MG
Ioannidis, A
Citation: Yl. Shen et al., Modification of indium tin oxide for improved hole injection in organic light emitting diodes, ADVAN MATER, 13(16), 2001, pp. 1234-1238
Citation: G. Koley et Mg. Spencer, Surface potential measurements on GaN and AlGaN/GaN heterostructures by scanning Kelvin probe microscopy, J APPL PHYS, 90(1), 2001, pp. 337-344
Citation: G. Koley et al., Cantilever effects on the measurement of electrostatic potentials by scanning Kelvin probe microscopy, APPL PHYS L, 79(4), 2001, pp. 545-547
Authors:
Lu, H
Schaff, WJ
Hwang, J
Wu, H
Koley, G
Eastman, LF
Citation: H. Lu et al., Effect of an AlN buffer layer on the epitaxial growth of InN by molecular-beam epitaxy, APPL PHYS L, 79(10), 2001, pp. 1489-1491
Citation: G. Koley et Mg. Spencer, Scanning Kelvin probe microscopy characterization of dislocations in III-nitrides grown by metalorganic chemical vapor deposition, APPL PHYS L, 78(19), 2001, pp. 2873-2875