Authors: Anopchenko, A Jergel, M Majkova, E Luby, S Holy, V Aschentrup, A Kolina, I Lim, YC Haindl, G Kleineberg, U Heinzmann, U

Citation: A. Anopchenko et al., Effect of substrate heating and ion beam polishing on the interface quality in Mo/Si multilayers - X-ray comparative study, PHYSICA B, 305(1), 2001, pp. 14-20