Authors:
Hayashi, H
Miura, N
Komatsubara, H
Fukuda, K
Citation: H. Hayashi et al., A simplified process modeling for reverse short channel effect of threshold voltage of MOSFET, IEICE TR EL, E84C(9), 2001, pp. 1234-1239
Authors:
Park, HJ
Doke, N
Miura, Y
Kawakita, K
Noritake, T
Komatsubara, H
Citation: Hj. Park et al., Induction of a sub-systemic oxidative burst by elicitor-stimulated local oxidative burst in potato plant tissues: a possible systemic signaling in systemic acquired resistance, PLANT SCI, 138(2), 1998, pp. 197-208