AAAAAA
Results:
1-7
|
Results: 7
Authors:
Oechsner, H
Bock, W
Kopnarski, M
Muller, M
Citation: H. Oechsner et al., INA-X: An advanced instrument for electron-gas SNMS, MIKROCH ACT, 133(1-4), 2000, pp. 69-73
Authors:
Dreer, S
Wilhartitz, P
Piplits, K
Hutter, H
Kopnarski, M
Friedbacher, G
Citation: S. Dreer et al., Quantitative sputter depth profiling of silicon- and aluminium oxynitride films, MIKROCH ACT, 133(1-4), 2000, pp. 75-87
Authors:
Kopnarski, M
Citation: M. Kopnarski, Application of microbeam techniques to materials problems in a service laboratory, MIKROCH ACT, 132(2-4), 2000, pp. 401-410
Authors:
Pidun, M
Lesch, N
Richter, S
Karduck, P
Bock, W
Kopnarski, M
Willich, P
Citation: M. Pidun et al., Comparative analysis of a solar control coating on glass by AES, EPMA, SNMS and SIMS, MIKROCH ACT, 132(2-4), 2000, pp. 429-434
Authors:
Getto, R
Freytag, J
Kopnarski, M
Oechsner, H
Citation: R. Getto et al., Characterization of sputtered titanium silicide ohmic contacts on n-type 6H-silicon carbide, MAT SCI E B, 61-2, 1999, pp. 270-274
Authors:
Angeli, J
Baumgartl, S
Beusse, R
Busch, P
Fakkeldij, EJM
Haeussler, EN
Karduck, P
Kopnarski, M
Pries, H
Sloof, WG
Wieland, HJ
Wirth, T
Citation: J. Angeli et al., Combined application of modern techniques for microarea analysis on metallic coated steel sheet, STEEL RES, 69(12), 1998, pp. 489-495
Authors:
Kopnarski, M
Angeli, J
Citation: M. Kopnarski et J. Angeli, Depth profile analysis with SNMS and GDOES, STEEL RES, 69(12), 1998, pp. 502-505
Risultati:
1-7
|