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Authors: Korambath, PP Singaraju, BK Karna, SP

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Citation: Cc. Carter et al., High resolution electronic spectroscopy of Kr center dot OH/D and an empirical potential energy surface, J CHEM PHYS, 110(3), 1999, pp. 1508-1520

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Citation: K. Vanheusden et al., The effect of near-interface network strain on proton trapping in SiO2, IEEE NUCL S, 46(6), 1999, pp. 1562-1567