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Results:
1-2
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Results: 2
Gettering issues using MeV ion implantation
Authors:
Rozgonyi, GA Glasko, JM Beaman, KL Koveshnikov, SV
Citation:
Ga. Rozgonyi et al., Gettering issues using MeV ion implantation, MAT SCI E B, 72(2-3), 2000, pp. 87-92
Defect diagnostics using scanning photoluminescence in multicrystalline silicon
Authors:
Tarasov, I Ostapenko, S Feifer, V McHugo, S Koveshnikov, SV Weber, J Haessler, C Reisner, EU
Citation:
I. Tarasov et al., Defect diagnostics using scanning photoluminescence in multicrystalline silicon, PHYSICA B, 274, 1999, pp. 549-552
Risultati:
1-2
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