Authors: Krafcsik, OH Vida, G Pocsik, I Josepovits, KV Deak, P

Citation: Oh. Krafcsik et al., Carbon diffusion through SiO2 from a hydrogenated amorphous carbon layer and accumulation at the SiO2/Si interface, JPN J A P 1, 40(4A), 2001, pp. 2197-2200

Authors: Kiss, G Krafcsik, OH Kovacs, K Josepovits, VK Fleischer, M Meixner, H Deak, P Reti, F

Citation: G. Kiss et al., Impedance spectroscopic and secondary ion mass spectrometric studies of beta-Ga2O3/O-2 interaction, THIN SOL FI, 391(2), 2001, pp. 239-242

Authors: Kiss, G Varhegyi, EB Mizsei, J Krafcsik, OH Kovacs, K Negyesi, G Ostrick, B Meixner, H Reti, F

Citation: G. Kiss et al., Examination of the CO/Pt/Cu layer structure with Kelvin probe and XPS analysis, SENS ACTU-B, 68(1-3), 2000, pp. 240-243