Authors: Krauss, TD O'Brien, S Brus, LE

Citation: Td. Krauss et al., Charge and photoionization properties of single semiconductor nanocrystals, J PHYS CH B, 105(9), 2001, pp. 1725-1733

Authors: Jiang, J Krauss, TD Brus, LE

Citation: J. Jiang et al., Electrostatic force microscopy characterization of trioctylphosphine oxideself-assembled monolayers on graphite, J PHYS CH B, 104(50), 2000, pp. 11936-11941

Authors: Krauss, TD Brus, LE

Citation: Td. Krauss et Le. Brus, Electronic properties of single semiconductor nanocrystals: optical and electrostatic force microscopy measurements, MAT SCI E B, 69, 2000, pp. 289-294

Authors: Krauss, TD Brus, LE

Citation: Td. Krauss et Le. Brus, Charge, polarizability, and photoionization of single semiconductor nanocrystals (vol 83, pg 4840, 1999), PHYS REV L, 84(7), 2000, pp. 1638-1638

Authors: Krauss, TD Brus, LE

Citation: Td. Krauss et Le. Brus, Charge, polarizability, and photoionization of single semiconductor nanocrystals, PHYS REV L, 83(23), 1999, pp. 4840-4843