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Results: 1
Hot-carrier effects on radio frequency noise characteristics of LDD n-typemetal-oxide-semiconductor field effect transistors
Authors:
Kwan, WS Chen, CH Deen, MJ
Citation:
Ws. Kwan et al., Hot-carrier effects on radio frequency noise characteristics of LDD n-typemetal-oxide-semiconductor field effect transistors, J VAC SCI A, 18(2), 2000, pp. 765-769
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