AAAAAA

   
Results: 1-14 |
Results: 14
Local structure of InxGa1-xAs semiconductor alloys by high-energy synchrotron x-ray diffraction - art. no. 205202
Authors: Jeong, IK Mohiuddin-Jacobs, F Petkov, V Billinge, SJL Kycia, S
Citation: Ik. Jeong et al., Local structure of InxGa1-xAs semiconductor alloys by high-energy synchrotron x-ray diffraction - art. no. 205202, PHYS REV B, 6320(20), 2001, pp. 5202
Evidence for charge localization in the ferromagnetic phase of La1-xCaxMnO3 from high real-space-resolution x-ray diffraction
Authors: Billinge, SJL Proffen, T Petkov, V Sarrao, JL Kycia, S
Citation: Sjl. Billinge et al., Evidence for charge localization in the ferromagnetic phase of La1-xCaxMnO3 from high real-space-resolution x-ray diffraction, PHYS REV B, 62(2), 2000, pp. 1203-1211
Enantiomorph determination using inverse reference-beam diffraction images
Authors: Shen, Q Kycia, S Dobrianov, I
Citation: Q. Shen et al., Enantiomorph determination using inverse reference-beam diffraction images, ACT CRYST A, 56, 2000, pp. 264-267
Triplet-phase measurements using reference-beam X-ray diffraction
Authors: Shen, Q Kycia, S Dobrianov, I
Citation: Q. Shen et al., Triplet-phase measurements using reference-beam X-ray diffraction, ACT CRYST A, 56, 2000, pp. 268-279
Recent structural studies of PtI
Authors: Bardeau, JF Eberhardt, AS Scott, B Billinge, S Kycia, S Egami, T Swanson, BI
Citation: Jf. Bardeau et al., Recent structural studies of PtI, SYNTH METAL, 103(1-3), 1999, pp. 2596-2597
Real-time x-ray scattering study of surface morphology evolution during ion erosion and epitaxial growth of Au(111)
Authors: Murty, MVR Curcic, T Judy, A Cooper, BH Woll, AR Brock, JD Kycia, S Headrick, RL
Citation: Mvr. Murty et al., Real-time x-ray scattering study of surface morphology evolution during ion erosion and epitaxial growth of Au(111), PHYS REV B, 60(24), 1999, pp. 16956-16964
High-energy x-ray diffraction study of pure amorphous silicon
Authors: Laaziri, K Kycia, S Roorda, S Chicoine, M Robertson, JL Wang, J Moss, SC
Citation: K. Laaziri et al., High-energy x-ray diffraction study of pure amorphous silicon, PHYS REV B, 60(19), 1999, pp. 13520-13533
New high temperature furnace for structure refinement by powder diffraction in controlled atmospheres using synchrotron radiation
Authors: Margulies, L Kramer, MJ McCallum, RW Kycia, S Haeffner, DR Lang, JC Goldman, AI
Citation: L. Margulies et al., New high temperature furnace for structure refinement by powder diffraction in controlled atmospheres using synchrotron radiation, REV SCI INS, 70(9), 1999, pp. 3554-3561
GaN nucleation and growth on sapphire(0001): Incorporation and interlayer transport
Authors: Woll, AR Headrick, RL Kycia, S Brock, JD
Citation: Ar. Woll et al., GaN nucleation and growth on sapphire(0001): Incorporation and interlayer transport, PHYS REV L, 83(21), 1999, pp. 4349-4352
High real-space resolution measurement of the local structure of Ga1-xInxAs using X-ray diffraction
Authors: Petkov, V Jeong, IK Chung, JS Thorpe, MF Kycia, S Billinge, SJL
Citation: V. Petkov et al., High real-space resolution measurement of the local structure of Ga1-xInxAs using X-ray diffraction, PHYS REV L, 83(20), 1999, pp. 4089-4092
High resolution radial distribution function of pure amorphous silicon
Authors: Laaziri, K Kycia, S Roorda, S Chicoine, H Robertson, JL Wang, J Moss, SC
Citation: K. Laaziri et al., High resolution radial distribution function of pure amorphous silicon, PHYS REV L, 82(17), 1999, pp. 3460-3463
Dynamical diffraction and x-ray standing waves from atomic planes normal to a twofold symmetry axis of the quasicrystal AlPdMn
Authors: Jach, T Zhang, Y Colella, R de Boissieu, M Boudard, M Goldman, AI Lograsso, TA Delaney, DW Kycia, S
Citation: T. Jach et al., Dynamical diffraction and x-ray standing waves from atomic planes normal to a twofold symmetry axis of the quasicrystal AlPdMn, PHYS REV L, 82(14), 1999, pp. 2904-2907
Quantitative treatment for extracting coherent elastic scattering from X-ray scattering experiments
Authors: Laaziri, K Roberson, JL Roorda, S Chicoine, M Kycia, S Wang, J Moss, SC
Citation: K. Laaziri et al., Quantitative treatment for extracting coherent elastic scattering from X-ray scattering experiments, J APPL CRYS, 32, 1999, pp. 322-326
X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
Authors: Darowski, N Pietsch, U Wang, KH Forchel, A Shen, Q Kycia, S
Citation: N. Darowski et al., X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures, THIN SOL FI, 336(1-2), 1998, pp. 271-276
Risultati: 1-14 |